How scanning probe microscopy can be supported by Artificial Intelligence and quantum computing
Agnieszka Pregowska, Agata Roszkiewicz, Magdalena Osial, Michael, Giersig

TL;DR
This paper explores how Artificial Intelligence and quantum computing can enhance Scanning Probe Microscopy by automating experiments, improving accuracy, and expanding practical applications, while discussing limitations and future research directions.
Contribution
It introduces the integration of AI and quantum computing to support and improve the efficiency and accuracy of Scanning Probe Microscopy techniques.
Findings
AI automates routine operations in microscopy
AI aids in selecting optimal sample regions
Quantum computing enhances the practical application potential
Abstract
We focus on the potential possibilities for supporting Scanning Probe Microscopy measurements, emphasizing the application of Artificial Intelligence, especially Machine Learning as well as quantum computing. It turned out that Artificial Intelligence can be helpful in the experimental processes automation in routine operations, the algorithmic search for good sample regions, and shed light on the structure property relationships. Thus, it contributes to increasing the efficiency and accuracy of optical nanoscopy scanning probes. Moreover, the combination of Artificial Intelligence based algorithms and quantum computing may have a huge potential to increase the practical application of Scanning Probe Microscopy. The limitations were also discussed. Finally, we outline a research path for the improvement of the proposed approach.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsForce Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Advanced Materials Characterization Techniques
MethodsFocus
