Photon number distribution of squeezed light from a silicon nitride microresonator measured without photon number resolving detectors

TL;DR

This paper demonstrates a method to reconstruct the photon number distribution of squeezed light from a silicon nitride microresonator using threshold detectors, enabling characterization without photon number resolving detectors.

Contribution

It introduces a novel approach to measure photon number distribution with threshold detectors, revealing non-classical features of microresonator-generated squeezed light.

Findings

Achieved on-chip squeezing level of 6.2 dB

Reconstructed PND up to 1.2 photons/pulse

Identified thermal background effects on photon correlations

Abstract

The measurement of the photon number distribution (PND) allows one to extract metrics of non-classicality of fundamental and technological relevance, but in principle it requires the use of detectors with photon number resolving (PNR) capabilities.In this work we reconstruct the PND of two-mode pulsed squeezed light generated from a silicon nitride microresonator using threshold detectors and variable optical attenuations. The PNDs are characterized up to 1.2 photons/pulse, through which we extracted an on-chip squeezing level of 6.2(2) dB and a noise reduction factor of -3.8(2) dB. The PNDs are successfully reconstructed up to an Hilbert space dimension of 6x6. The analysis performed on the photon-number basis allows us to characterize the influence of a spurious thermal background field that spoils the photon number correlations. We evaluate the impact of self and cross phase modulation on the generation efficiency in case of a pulsed pump, and validate the results through numerical simulations of the master equation of the system.