Nanometer-resolution 3D Tomographic and Vectorial Near-field Imaging in Dielectric Optical Resonators
Bingbing Zhu, Qingnan Cai, Yaxin Liu, Sheng Zhang, Weifeng Liu, Qiong, He, Lei Zhou, Zhensheng Tao

TL;DR
This paper introduces a high-resolution 3D imaging technique for dielectric nano-resonators that captures detailed near-field wave patterns, including phase and polarization, enabling comprehensive characterization of electromagnetic behavior at the nanoscale.
Contribution
The authors develop a novel phase-sensitive high-order sideband generation method for three-dimensional, vectorial near-field imaging inside dielectric optical resonators with nanometer resolution.
Findings
Achieved 3D tomographic imaging of near-fields inside silicon resonators.
Demonstrated phase-resolving and polarization-sensitive near-field detection.
Potential for broad application in dielectric metamaterials characterization.
Abstract
All-dielectric optical nano-resonators, exhibiting exotic near-field distributions upon excitations, have emerged as low-loss, versatile and highly adaptable components in nanophotonic structures for manipulating electromagnetic waves and enhancing light-matter interactions. However, achieving experimental full three-dimensional characterization of near-fields within dielectric nano-resonators poses significant challenges. Here, we develop a novel technique using high-order sideband generation to image near-field wave patterns inside dielectric optical nano-resonators. By exploiting the phase-sensitivity of various harmonic orders that enables the detection of near-field distributions at distinct depths, we achieve three-dimensional tomographic and near-field imaging with nanometer resolution inside a micrometer-thick silicon anapole resonator. Furthermore, our method offers…
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Taxonomy
TopicsMicrowave and Dielectric Measurement Techniques · Advanced MEMS and NEMS Technologies · Microwave Imaging and Scattering Analysis
