Evidence for polyimide redeposition and possible correlation with sparks in Gas Electron Multipliers working in CF$_4$ mixtures

TL;DR

This study investigates the aging mechanisms of Gas Electron Multipliers in CF4 mixtures, revealing polyimide redeposition and chromium diffusion as factors leading to sparks and potential detector failure.

Contribution

It provides the first evidence of polyimide redeposition and chromium diffusion in GEMs, emphasizing the importance of surface analysis for detector longevity.

Findings

Polyimide redeposition contributes to insulating layer formation.

Chromium diffusion blurs electrode layered structure.

Surface analysis is crucial for understanding GEM aging.

Abstract

Research on aging processes of Gas Electron Multipliers (GEMs) is important to obtain insights on how to increase the detector's longevity, stability, and performance, as highlighted in the latest developments roadmap by the European Council of Future Accelerators (ECFA). One key aspect of the aging process is the deposit formation on the electrodes surfaces. In this work, through the analysis of the molecular content on the surface of a used GEM, we provide evidence for polyimide redeposition as a source of organic material contributing to the formation of insulating layers on the electrodes, which eventually lead to sparks and detector failure. Furthermore, we show that chromium, used to promote adhesion between copper and polyimide, in the device undergoes a diffusion process, effectively blurring the layered structure. We demonstrate the significance of surface-sensitive chemical analysis to investigate the surface deposits on electrodes of gaseous detectors and our results reveal the necessity of standardization and more stringent study protocols.