Simulation of bright and dark diffuse multiple scattering lines in high-flux synchrotron X-ray experiments
M. B. Estradiote, A. G. A. Nisbet, R. F. S. Penacchio, M. A. R., Miranda, G. A. Calligaris, S. L. Morelhao

TL;DR
This paper develops a theoretical model for diffuse multiple scattering in single crystals, especially in high-flux synchrotron X-ray experiments, to better understand and visualize Kossel lines and DMS phenomena.
Contribution
It introduces a comprehensive framework for modeling diffuse scattering-Bragg channels, including mosaicity and second-order effects, advancing the analysis of DMS in materials.
Findings
Model accurately predicts intensity distribution along Kossel lines.
Highlights the role of mosaicity and second-order scattering in DMS.
Enables DMS to be used as probes for complex material behaviors.
Abstract
We present a theoretical framework for understanding diffuse multiple scattering (DMS) in single crystals, focusing on diffuse scattering-Bragg (DS-Bragg) channels. These channels, when probed with high-flux, low-divergent monochromatic synchrotron X-rays, provide well-defined visualizations of Kossel lines. Our main contribution lies in modeling the intensity distribution along these lines by considering DS around individual reciprocal lattice nodes. The model incorporates contributions from both general DS and mosaicity, elucidating their connection to second-order scattering events. This comprehensive approach advances our understanding of DMS phenomena, enabling their use as probes for complex material behavior, particularly under extreme conditions.
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Crystallography and Radiation Phenomena · Advanced X-ray and CT Imaging
