The Focal-plane Actualized Shifted Technique Realized for a Shack Hartmann Wavefront Sensor (fastrSHWFS)
Benjamin L. Gerard, Aaron Lemmer, Bautista R. Fernandez, Xiaoxing Xia,, Cesar Laguna, Mike Kim, Stephen Mark Ammons, Brian Bauman, and Lisa Poyneer

TL;DR
This paper introduces fastrSHWFS, a modified Shack Hartmann Wavefront Sensor that uses a phase mask to significantly reduce detector readout time, aiming to improve adaptive optics for exoplanet imaging.
Contribution
The paper presents a novel phase mask design for SHWFS that redistributes spots to decrease readout time, enhancing AO system performance.
Findings
Potential to reduce readout time by up to 30x
Preliminary laboratory tests validate the concept
Supports improved AO lag reduction for exoplanet imaging
Abstract
Astronomical adaptive optics (AO) is a critical approach to enable ground-based diffraction-limited imaging and high contrast science, with the potential to enable habitable exoplanet imaging on future extremely large telescopes. However, AO systems must improve significantly to enable habitable exoplanet imaging. Time lag between the end of an exposure and end of deformable mirror commands being applied in an AO loop is now the dominant error term in many extreme AO systems (e.g., Poyneer et al. 2016), and within that lag component detector read time is becoming non-negligible (e.g., Cetre et al. 2018). This term will decrease as faster detector readout capabilities are developed by vendors. In complement, we have developed a modified Shack Hartmann Wavefront Sensor (SHWFS) to address this problem called the Focal-plane Actualized Shifted Technique Realized for a SHWFS (fastrSHWFS).…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdaptive optics and wavefront sensing · Optical Systems and Laser Technology · Advanced Measurement and Metrology Techniques
