A Labeled Array Distance Metric for Measuring Image Segmentation Quality
Maryam Berijanian, Katrina Gensterblum, Doruk Alp Mutlu, Katelyn Reagan, Andrew Hart, Dirk Colbry

TL;DR
This paper introduces two new distance metrics, LAD and MADLAD, for comparing labeled array outputs of image segmentation algorithms, enabling efficient evaluation of segmentation accuracy against ground truth.
Contribution
The paper proposes two novel, efficient distance metrics for comparing labeled images, improving the evaluation of segmentation algorithms with different labeling schemes.
Findings
LAD and MADLAD operate with O(N) complexity for images with N pixels.
The metrics effectively distinguish between manual and algorithm-generated labels.
They facilitate automated selection of optimal segmentation algorithms.
Abstract
This work introduces two new distance metrics for comparing labeled arrays, which are common outputs of image segmentation algorithms. Each pixel in an image is assigned a label, with binary segmentation providing only two labels ('foreground' and 'background'). These can be represented by a simple binary matrix and compared using pixel differences. However, many segmentation algorithms output multiple regions in a labeled array. We propose two distance metrics, named LAD and MADLAD, that calculate the distance between two labeled images. By doing so, the accuracy of different image segmentation algorithms can be evaluated by measuring their outputs against a 'ground truth' labeling. Both proposed metrics, operating with a complexity of for images with pixels, are designed to quickly identify similar labeled arrays, even when different labeling methods are used. Comparisons…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMedical Image Segmentation Techniques · Industrial Vision Systems and Defect Detection
