Coexistence of ferroelectric and ferrielectric phases in ultrathin antiferroelectric PbZrO3 thin films
Ying Liu, Ranming Niu, Roger Uriach, David Pesquera, Jose Manuel Caicedo Roque, Jose Santiso, Julie M Cairney, Xiaozhou Liao, Jordi Arbiol, and Gustau Catalan

TL;DR
This study reveals that ultrathin PbZrO3 films exhibit coexistence of ferroelectric and ferrielectric phases, with a transition from antiferroelectric to ferroelectric behavior around 10-15 nm thickness, impacting device design.
Contribution
It provides the first detailed microstructural analysis showing coexistence of phases in ultrathin PbZrO3 films, highlighting the critical thickness for phase transition.
Findings
Transition from antiferroelectric to ferroelectric behavior at 10-15 nm thickness
Presence of ferrielectric phase with unique dipole configuration
Ferroelectric unit cell is half the size of the antiferroelectric phase
Abstract
Whereas ferroelectricity may vanish in ultra-thin ferroelectric films, it is expected to emerge in ultra-thin anti-ferroelectric films, sparking people's interest in using antiferroelectric materials as an alternative to ferroelectric ones for high-density data storage applications. Lead Zirconate (PbZrO3) is considered the prototype material for antiferroelectricity, and indeed previous studies indicated that nanoscale PbZrO3 films exhibit ferroelectricity. The understanding of such phenomena from the microstructure aspect is crucial but still lacking. In this study, we fabricated a PbZrO3 film with thicknesses varying from 5 nm to 80 nm. Using Piezoresponse Force Microscopy, we discovered the film displayed a transition from antiferroelectric behaviour in the thicker areas to ferroelectric behaviour in the thinner ones, with a critical thickness between 10 and 15 nm. In this critical…
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Taxonomy
TopicsFerroelectric and Piezoelectric Materials · Solid-state spectroscopy and crystallography · Multiferroics and related materials
