Readout Error Mitigation for Mid-Circuit Measurements and Feedforward
Jin Ming Koh, Dax Enshan Koh, Jayne Thompson

TL;DR
This paper introduces a general protocol to mitigate mid-circuit measurement errors in quantum computing, significantly improving accuracy without increasing circuit complexity, especially beneficial for NISQ devices.
Contribution
A novel error mitigation method that effectively reduces mid-circuit measurement errors with feedforward, maintaining circuit depth and gate count, applicable to various quantum circuits.
Findings
Achieves up to 60% error reduction on superconducting processors.
Effective for circuits with multiple feedforward layers.
Applicable to dynamic qubit resets, GHZ state prep, and quantum teleportation.
Abstract
Current quantum computing platforms suffer from readout errors, where faulty measurement outcomes are reported by the device. These errors are particularly harmful in quantum programs that rely on branch statements wherein operations in later parts of the program are dynamically determined by mid-circuit measurements. We propose a general protocol for mitigating mid-circuit measurement errors in the presence of feedforward, offering an efficient solution that works for any number of feedforward layers without increasing circuit depth or two-qubit gate counts, making it highly suitable for noisy intermediate-scale quantum (NISQ) devices. Our method demonstrates up to a reduction in error on superconducting quantum processors across several practically relevant feedforward circuits, including dynamic qubit resets, shallow-depth GHZ state preparation, and multi-stage quantum…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnalog and Mixed-Signal Circuit Design · Advanced Electrical Measurement Techniques · VLSI and Analog Circuit Testing
