PatentEval: Understanding Errors in Patent Generation
You Zuo (ALMAnaCH), Kim Gerdes (LISN), Eric Villemonte de La Clergerie, (ALMAnaCH), Beno\^it Sagot (ALMAnaCH)

TL;DR
This paper introduces a detailed error typology and a benchmark called PatentEval for assessing machine-generated patent texts, comparing various models and evaluating metrics against human judgments.
Contribution
It presents a new error typology and benchmark for evaluating patent text generation, including a comparative analysis of models and assessment metrics.
Findings
Human-annotated analysis of model performance
Evaluation of metrics against expert judgments
Insights into language models' capabilities in patent generation
Abstract
In this work, we introduce a comprehensive error typology specifically designed for evaluating two distinct tasks in machine-generated patent texts: claims-to-abstract generation, and the generation of the next claim given previous ones. We have also developed a benchmark, PatentEval, for systematically assessing language models in this context. Our study includes a comparative analysis, annotated by humans, of various models. These range from those specifically adapted during training for tasks within the patent domain to the latest general-purpose large language models (LLMs). Furthermore, we explored and evaluated some metrics to approximate human judgments in patent text evaluation, analyzing the extent to which these metrics align with expert assessments. These approaches provide valuable insights into the capabilities and limitations of current language models in the specialized…
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Code & Models
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Taxonomy
TopicsIntellectual Property and Patents
MethodsALIGN
