ARMA Processes with Discrete-Continuous Excitation: Compressibility Beyond Sparsity
Mohammad-Amin Charusaie, Stefano Rini, Arash Amini

TL;DR
This paper analyzes the information dimension rate and block information dimension of ARMA processes with discrete-continuous excitation, revealing that their compressibility matches that of their excitation noise, extending understanding beyond sparse sources.
Contribution
It establishes the relationship between IDR, BID, and $\\epsilon$-achievable compression rates for ARMA processes with mixed excitation noise, a novel extension beyond prior specific process types.
Findings
RID and $\\epsilon$-achievable rates equal to excitation noise
Samples can be compressed as much as sparse excitation noise
Results applicable to locally correlated data with finite or infinite memory
Abstract
R\'enyi Information Dimension (RID) plays a central role in quantifying the compressibility of random variables with singularities in their distribution, encompassing and extending beyond the class of sparse sources. The RID, from a high perspective, presents the average number of bits that is needed for coding the i.i.d. samples of a random variable with high precision. There are two main extensions of the RID for stochastic processes: information dimension rate (IDR) and block information dimension (BID). In addition, a more recent approach towards the compressibility of stochastic processes revolves around the concept of -achievable compression rates, which treat a random process as the limiting point of finite-dimensional random vectors and apply the compressed sensing tools on these random variables. While there is limited knowledge about the interplay of the the BID, the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Materials Characterization Techniques · Force Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
