Spatial resolution improvements with finer-pitch GEMs
K.J. Fl\"othner (1,2), L. Scharenberg (1), A. Brask (3,1), F., Brunbauer (1), F. Garcia (4), D. Janssens (1), B. Ketzer (2), M. Lisowska, (1,5), H. Muller (1,6), E. Oliveri (1), G. Orlandini (1,7), D. Pfeiffer, (8,1), L. Ropelewski (1), J. Samarati (8,1), M. Van Stenis (1)
TL;DR
This paper demonstrates that using GEMs with a finer 90 um pitch improves spatial resolution in particle detectors, with additional insights into the influence of electronics on performance.
Contribution
The study introduces the use of finer-pitch GEMs (90 um) for enhanced spatial resolution in triple-GEM detectors with X-Y strip readout.
Findings
Finer GEM pitch of 90 um improves spatial resolution.
Electronics impact on resolution was analyzed.
Results support using finer GEMs for better detector precision.
Abstract
Gas Electron Multipliers (GEMs) are used in many particle physics experiments, employing their 'standard' configuration with amplification holes of 140 um pitch in a hexagonal pattern. However, the collection of the charge cloud from the primary ionisation electrons from the drift region of the detector into the GEM holes affects the position information from the initial interacting particle. In this paper, the results from studies with a triple-GEM detector with an X-Y-strip readout anode are presented. It is demonstrated that GEMs with a finer hole pitch of here 90 um improve the detector's spatial resolution. Within these studies, also the impact of the front-end electronics on the spatial resolution was investigated, which is briefly discussed in the paper.
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