SpikeMM: Flexi-Magnification of High-Speed Micro-Motions
Baoyue Zhang, Yajing Zheng, Shiyan Chen, Jiyuan Zhang, Kang Chen,, Zhaofei Yu, Tiejun Huang

TL;DR
SpikeMM is a novel spike-based algorithm designed to magnify high-speed micro-motions by leveraging spike camera data, overcoming limitations of traditional methods in high-frequency scenarios.
Contribution
It introduces SpikeMM, a self-supervised, spike-based motion magnification method that integrates multi-level information extraction and spatial upsampling for high-speed motion analysis.
Findings
Effective magnification of high-speed micro-motions demonstrated
Seamless integration with super-resolution algorithms achieved
Validated on real-world spike camera scenes
Abstract
The amplification of high-speed micro-motions holds significant promise, with applications spanning fault detection in fast-paced industrial environments to refining precision in medical procedures. However, conventional motion magnification algorithms often encounter challenges in high-speed scenarios due to low sampling rates or motion blur. In recent years, spike cameras have emerged as a superior alternative for visual tasks in such environments, owing to their unique capability to capture temporal and spatial frequency domains with exceptional fidelity. Unlike conventional cameras, which operate at fixed, low frequencies, spike cameras emulate the functionality of the retina, asynchronously capturing photon changes at each pixel position using spike streams. This innovative approach comprehensively records temporal and spatial visual information, rendering it particularly suitable…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Surface Polishing Techniques · Iterative Learning Control Systems · Advanced Measurement and Metrology Techniques
