Fast Bayesian Basis Selection for Functional Data Representation with Correlated Errors
Ana Carolina da Cruz, Camila P. E. de Souza, Pedro H. T. O. Sousa

TL;DR
This paper introduces a fast Bayesian basis selection method for functional data that accounts for correlated errors and uses a variational EM algorithm, outperforming traditional methods in various datasets.
Contribution
It presents a novel Bayesian approach with a VEM algorithm for basis selection in functional data, explicitly modeling correlated errors and improving computational efficiency.
Findings
Effectively identifies true data structure across scenarios.
Estimates basis coefficients and within-curve correlation accurately.
Demonstrates superior or comparable performance to existing methods.
Abstract
Functional data analysis finds widespread application across various fields. While functional data are intrinsically infinite-dimensional, in practice, they are observed only at a finite set of points, typically over a dense grid. As a result, smoothing techniques are often used to approximate the observed data as functions. In this work, we propose a novel Bayesian approach for selecting basis functions for smoothing one or multiple curves simultaneously. Our method differentiates from other Bayesian approaches in two key ways: (i) by accounting for correlated errors and (ii) by developing a variational Expectation-Maximization (VEM) algorithm, which is faster than Markov chain Monte Carlo (MCMC) methods such as Gibbs sampling. Simulation studies demonstrate that our method effectively identifies the true underlying structure of the data across various scenarios, and it is applicable…
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Taxonomy
TopicsFault Detection and Control Systems · Neural Networks and Applications · Anomaly Detection Techniques and Applications
