Barrier height inhomogeneity and origin of 1/f-noise in topological insulator-based photo-detector
Sk Kalimuddin, Biswajit Das, Sudipta Chatterjee, Arnab Bera, Satyabrata Bera, Kalyan Kumar Chattopadhyay, Mintu Mondal

TL;DR
This study investigates the 1/f noise and barrier inhomogeneity in a topological insulator-silicon heterojunction photodetector, revealing insights into trap states and noise behavior crucial for device performance.
Contribution
It provides a detailed analysis of 1/f noise origins and barrier height inhomogeneity in TI-based photodetectors using temperature-dependent measurements.
Findings
Homogeneous barrier height distribution indicated by 1/f noise spectra
Trap states significantly influence optoelectronic transport
Hybrid heterojunction shows promising photo-response with low noise
Abstract
Topological insulators (TIs) with symmetry-protected surface states, offer exciting opportunities for next-generation photonic and optoelectronic device applications. The heterojunctions of TIs and semiconductors (e.g. Si, Ge) have been observed to excellent photo-responsive characteristics. However, the realization of high-frequency operations in these heterojunctions can be hindered by unwanted 1/f (or Flicker) noise and phase noise. Therefore, an in-depth understanding of 1/f noise figures becomes paramount for the effective utilization of such materials.Here we report optoelectronic response and 1/f noise characteristics of a p-n diode fabricated using topological insulator, Bi2Se3 and silicon for potential photo-detector. Through meticulous temperature-dependent current-voltage (I-V) and capacitance-voltage (C-V) measurements, we ascertain crucial parameters like barrier height,…
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