Characterization of ion-trap-induced ac-magnetic fields

TL;DR

This paper presents a two-photon spectroscopy method to measure and characterize rf-induced magnetic fields in ion traps, aiding precision experiments by avoiding modifications to existing trap parameters.

Contribution

The authors introduce a novel, non-invasive technique to determine the strength and direction of rf-induced magnetic fields in ion traps using two-photon spectroscopy.

Findings

Method accurately measures rf magnetic field strength and direction.

Applicable to various trapped-ion experiments with narrow linewidth transitions.

Enhances precision spectroscopy by characterizing trap-induced magnetic fields.

Abstract

The oscillating magnetic field produced by unbalanced currents in radio-frequency ion traps induces transition frequency shifts and sideband transitions that can be harmful to precision spectroscopy experiments. Here, we describe a methodology, based on two-photon spectroscopy, for determining both the strength and direction of rf-induced magnetic fields without modifying any DC magnetic bias field or changing any trap RF power. The technique is readily applicable to any trapped-ion experiment featuring narrow linewidth transitions.