Two-dimensional Synchrotron Beam Characterisation from a Single Interferogram

TL;DR

This paper introduces a novel method for two-dimensional synchrotron beam characterization using a single interferogram, combining aperture masking and self-calibration techniques to achieve high accuracy and robustness.

Contribution

It develops a new technique that enhances beam measurement accuracy by integrating non-redundant aperture masking with self-calibration, inspired by astronomy methods.

Findings

Accurate 2D beam characterization from a single 1 ms interferogram.

Method resistant to spatial phase fluctuations caused by vibrations.

Validated with tests at the ALBA synchrotron.

Abstract

Double-aperture Young interferometry is widely used in accelerators to provide a one-dimensional beam measurement. We improve this technique by combining and further developing techniques of non-redundant, two-dimensional, aperture masking and self-calibration from astronomy. Using visible synchrotron radiation, tests at the ALBA synchrotron show that this method provides an accurate two-dimensional beam transverse characterisation, even from a single 1 ms interferogram. The non-redundancy of the aperture mask in the technique enables it to be resistant to spatial phase fluctuations that might be introduced by vibration of optical components, or in the laboratory atmosphere.