Geometric Phase and Nanoscale Architected Morphology of Reusch Piles

TL;DR

This paper explores how the geometric phase in Reusch piles is sensitive to nanoscale morphological variations, potentially enabling the detection of fabrication differences through spectral analysis.

Contribution

It introduces the idea that the geometric-phase spectrum of Reusch piles can reveal nanoscale morphological details linked to fabrication methods.

Findings

Geometric phase is sensitive to nanoscale morphology.

Spectral signatures can indicate fabrication techniques.

Potential for optical device optimization based on morphology.

Abstract

The geometric phase has acquired interest for optical devices such as achromatic phase shifters, spatial light modulators, frequency shifters, and planar lenses for wavefront engineering. Numerical work with Reusch piles with a large number of layers per period suggests that the geometric phase of the reflected/transmitted plane wave may be sensitive to nanoscale morphological differences, and the geometric-phase spectrum could contain signatures of morphological details that depend on the fabrication technique.