Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions
Zezhong Zhang, Ivan Lobato, Hamish Brown, Dirk Lamoen, Daen Jannis,, Johan Verbeeck, Sandra Van Aert, Peter D. Nellist

TL;DR
This paper develops relativistic electron energy-loss spectroscopy (EELS) cross-section calculations using Dirac solutions, improving accuracy for heavy elements and enabling better microanalysis.
Contribution
It introduces a comprehensive relativistic GOS database based on Dirac solutions for all elements, surpassing previous Schrödinger-based models.
Findings
Relativistic effects significantly impact GOS calculations for heavy elements.
The new database covers all elements up to Z=118 and all excitation edges.
Open-source GOS data enhances EELS analysis accuracy and application scope.
Abstract
The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, exciting bound electrons from their ground states to higher unoccupied states. To quantify EELS, the common practice is to compare the cross-sections integrated within an energy window or fit the observed spectrum with theoretical differential cross-sections calculated from a generalized oscillator strength (GOS) database with experimental parameters. The previous Hartree-Fock-based and DFT-based GOS are calculated from Schr\"odinger's solution of atomic orbitals, which does not include the full relativistic effects. Here, we attempt to go beyond the limitations of the Schr\"odinger solution in the GOS tabulation by including the full relativistic effects using the Dirac equation within the local density…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Advanced Materials Characterization Techniques
