An indirect geometry crystal time-of-flight spectrometer for FRM II

TL;DR

This paper proposes a novel indirect geometry crystal time-of-flight spectrometer design for the FRM II reactor, combining a primary TOF system with a large crystal analyzer to enhance reciprocal space coverage and energy resolution.

Contribution

It introduces a new spectrometer concept utilizing nested mirror optics and a flexible dynamical range at a continuous neutron source, improving experimental adaptability.

Findings

Enhanced reciprocal space coverage and intensity.

Flexible dynamical range matching experimental needs.

Excellent energy resolution with a small neutron spot.

Abstract

We present a concept for an indirect geometry crystal time-of-flight spectrometer, which we propose for a source similar to the FRM-II reactor in Garching. Recently, crystal analyzer spectrometers at modern spallation sources have been proposed and are under construction. The secondary spectrometers of these instruments are evolutions of the flat cone multi-analyzer for three-axis spectrometers (TAS). The instruments will provide exceptional reciprocal space coverage and intensity to map out the excitation landscape in novel materials. We will discuss the benefits of combining a time-of-flight primary spectrometer with a large crystal analyzer spectrometer at a continuous neutron source. The dynamical range can be very flexibly matched to the requirements of the experiment without sacrificing the neutron intensity. At the same time, the chopper system allows a quasi-continuous variation of the initial energy resolution. The neutron delivery system of the proposed instrument is based on the novel nested mirror optics, which images neutrons from the position of the pulse cutting chopper representing a bright virtual source onto the sample. The spot size of less than 1 cm x 1 cm at the virtual source allows the realization of very short neutron pulses by the choppers, while the small and well-defined spot size at the sample position provides an excellent energy resolution of the secondary spectrometer.