Application of Probabilistic-bit in Precision Measurements

TL;DR

This paper introduces a new precision measurement technique using ensembles of probabilistic bits (p-bits), which leverages their fluctuations for high sensitivity in sensing applications, scalable and robust against imperfections.

Contribution

It presents a novel measurement approach based on p-bits, demonstrating scalability, robustness, and potential for cost-effective high-precision sensing.

Findings

Sensitivity scales with the square root of p-bits ensemble size

Method is robust against device imperfections

Enables high-accuracy measurements in various sensing applications

Abstract

We propose a novel approach for precision measurement utilizing an ensemble of probabilistic bits (p-bits). This method leverages the inherent fluctuations of p-bits to achieve high sensitivity in various applications, including magnetic field sensing, temperature monitoring and timekeeping. The sensitivity scales proportionally to the square root of the total number of p-bits, enabling unprecedented accuracy with large ensembles. Furthermore, the robustness of this method against device imperfections and non-uniformity enhances its practicality and scalability. This work paves the way for a new paradigm in precision measurement, offering a cost-effective and versatile alternative to traditional methods.