Reducing the oxygen contamination in conductive (Ti,Zr)N coatings via RF-bias assisted reactive sputtering

TL;DR

This study introduces a practical RF-bias assisted reactive sputtering method to significantly reduce oxygen contamination in (Ti,Zr)N coatings, enhancing their conductivity and hardness for various applications.

Contribution

It demonstrates a novel, scalable approach to produce oxygen-free (Ti,Zr)N thin films across the entire compositional range using combinatorial sputtering and RF biasing.

Findings

RF bias reduces oxygen contamination regardless of composition.

Oxygen reduction improves film conductivity and hardness.

Solid solution formation is confirmed across all compositions.

Abstract

Ternary transition metal nitride coatings are promising for many applications as they can offer improved hardness and oxidation resistance compared to binary counterparts. A common challenge in the deposition of functional nitride thin films is oxygen contamination. Even low amounts of oxygen contamination can adversely affect the functional properties of the thin films. Here, we present a practical approach for the growth of virtually oxygen-free (Ti, Zr)N thin films. To cover the complete compositional range of (Ti,Zr)N coatings we employ combinatorial reactive co-sputtering. The depositions are carried out with or without applying a low-power radio-frequency (RF) bias voltage to the substrate holder to study the possibility of decelerating energetic oxygen ions and effectively reducing oxygen contamination in the growing film. High-throughput structural analysis and functional property mapping are used to elucidate the synthesis-property relationships. The structural analysis indicates solid solution formation over the entire compositional range, as evidenced by Vegardian lattice scaling, regardless of the applied RF substrate bias. Irrespective of the composition of the films, the application of RF substrate bias leads to a dramatic reduction of oxygen contamination, as demonstrated by X-ray photoelectron spectroscopy (XPS) depth-profile mapping. This is reflected in a significant improvement in the films' conductivity and hardness. We demonstrate that the reduction in oxygen contamination is intrinsic to the process and not due to changes in the microstructure. The approach presented here is applicable to both conductive and insulating substrates and provides a practical route to synthesize nitride thin films with improved purity that can be applied in standard sputter chambers and on many different material systems.