Efficient Pretraining Model based on Multi-Scale Local Visual Field Feature Reconstruction for PCB CT Image Element Segmentation
Chen Chen, Kai Qiao, Jie Yang, Jian Chen, Bin Yan

TL;DR
This paper introduces an efficient self-supervised pretraining model for PCB CT image element segmentation that focuses on local visual features, improving accuracy and reducing training time.
Contribution
It proposes a multi-scale local visual field feature reconstruction method combined with teacher-guided Masked Image Modeling for PCB CT segmentation.
Findings
Achieves 88.6% mIoU on PCB CT dataset.
Reduces training time by 17.4%.
Outperforms baseline by 1.2% mIoU.
Abstract
Element segmentation is a key step in nondestructive testing of Printed Circuit Boards (PCB) based on Computed Tomography (CT) technology. In recent years, the rapid development of self-supervised pretraining technology can obtain general image features without labeled samples, and then use a small amount of labeled samples to solve downstream tasks, which has a good potential in PCB element segmentation. At present, Masked Image Modeling (MIM) pretraining model has been initially applied in PCB CT image element segmentation. However, due to the small and regular size of PCB elements such as vias, wires, and pads, the global visual field has redundancy for a single element reconstruction, which may damage the performance of the model. Based on this issue, we propose an efficient pretraining model based on multi-scale local visual field feature reconstruction for PCB CT image element…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Image and Object Detection Techniques · Medical Image Segmentation Techniques
MethodsPart-based Convolutional Baseline · Mutual Information Machine/Mask Image Modeling
