Shape-Optimized Electrooptic Beam Scanners: Experiment
Jennifer C. Fang, M. J. Kawas, J. Zou, V. Gopalan, T. E. Schlesinger,, Daniel D. Stancil

TL;DR
This paper introduces a horn-shaped electrooptic beam scanner with enhanced sensitivity, demonstrating through simulations and experiments that its shape optimization doubles the sensitivity compared to traditional rectangular designs.
Contribution
The paper presents a novel horn-shaped electrooptic scanner design that follows the beam trajectory, achieving significantly higher sensitivity than rectangular devices.
Findings
Scanner shape optimization doubles sensitivity
Experimental results confirm improved performance
Simulations match measured device behavior
Abstract
A new horn-shaped electrooptic scanner is described with significantly improved scanning sensitivity over rectangular-shaped devices. In the new device, the shape of the scanner is chosen to follow the trajectory of the beam. An example design is described that exhibits a factor of two larger scanning sensitivity than a rectangular device with comparable maximum scanning angle. Beam propagation simulations and measurements on an experimental device verify the scanner performance.
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