Characterization of errors in a CNOT between surface code patches
B\'alint Domokos, \'Aron M\'arton, J\'anos K. Asb\'oth

TL;DR
This paper analyzes the errors in a lattice-surgery-based CNOT operation between surface code patches, optimizing measurement rounds and characterizing the logical error channel under physical error models.
Contribution
It introduces an optimized measurement protocol and provides a detailed characterization of the logical error channel for surface code CNOTs.
Findings
Optimal measurement rounds vary with error rates and patch separation.
Logical error channel exhibits symmetry and error correlations are suppressed.
Provides guidelines for fault-tolerant quantum circuit implementation.
Abstract
As current experiments already realize small quantum circuits on error corrected qubits, it is important to fully understand the effect of physical errors on the logical error channels of these fault-tolerant circuits. Here, we investigate a lattice-surgery-based CNOT operation between two surface code patches under phenomenological error models. (i) For two-qubit logical Pauli measurements -- the elementary building block of the CNOT -- we optimize the number of stabilizer measurement rounds, usually taken equal to , the size (code distance) of each patch. We find that the optimal number can be greater or smaller than , depending on the rate of physical and readout errors, and the separation between the code patches. (ii) We fully characterize the two-qubit logical error channel of the lattice-surgery-based CNOT. We find a symmetry of the CNOT protocol, that results in a symmetry…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsRadiation Effects in Electronics · Parallel Computing and Optimization Techniques · Semiconductor materials and devices
