Intrinsic Current Concentration of Buffer Layer Material for Cable Ablation Failure: Role of Random Fiber Networks
Haoran Zhang, Jianying Li

TL;DR
This study investigates the intrinsic current concentration in buffer layers of high voltage cables, revealing microstructural inhomogeneity as a key factor in ablation failure through experiments and simulations.
Contribution
It introduces a combined experimental and simulation approach to understand how microstructural inhomogeneity causes current concentration and failure in buffer layers.
Findings
Current concentrates at specific sites within buffer layers.
Increasing fiber density reduces current concentration factors.
Microstructural inhomogeneity is linked to ablation failure.
Abstract
In recent years, the buffer layer ablation failures of high voltage cables are frequently reported by the power systems. Previous studies have dominantly regarded the buffer layer as the continuous homogeneous medium, whereas neglects its microstructures. In this paper, the current distribution within the random fiber networks of buffer layer are investigated. Experiment results of our self-designed platform revealed an uneven current distribution in buffer layer at the moment of bearing current. This phenomenon is named as the intrinsic current concentration where the current density concentrates at certain sites inner the buffer layer. And the degree of current concentration will be suppressed by compressing the sample. Then, a 2D simulation model of the random fiber networks was constructed based on the Mikado model. The simulation results also presented an uneven current…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIntegrated Circuits and Semiconductor Failure Analysis · Electrostatic Discharge in Electronics · Electrical Contact Performance and Analysis
