DRAMScope: Uncovering DRAM Microarchitecture and Characteristics by Issuing Memory Commands
Hwayong Nam, Seungmin Baek, Minbok Wi, Michael Jaemin Kim, Jaehyun, Park, Chihun Song, Nam Sung Kim, Jung Ho Ahn

TL;DR
This paper introduces DRAMScope, a methodology for reverse-engineering DRAM microarchitecture and error behaviors using memory command analysis, revealing new vulnerabilities and improving understanding of DRAM behavior.
Contribution
It presents a comprehensive approach combining tools like AIBs, retention tests, and RowCopy to accurately uncover DRAM microarchitecture and error characteristics, correcting prior misconceptions.
Findings
Uncovered detailed microarchitectural features of commodity DRAM chips.
Discovered new data patterns that accelerate activate-induced bitflips.
Identified previously unknown AIB vulnerabilities and proposed protection methods.
Abstract
The demand for precise information on DRAM microarchitectures and error characteristics has surged, driven by the need to explore processing in memory, enhance reliability, and mitigate security vulnerability. Nonetheless, DRAM manufacturers have disclosed only a limited amount of information, making it difficult to find specific information on their DRAM microarchitectures. This paper addresses this gap by presenting more rigorous findings on the microarchitectures of commodity DRAM chips and their impacts on the characteristics of activate-induced bitflips (AIBs), such as RowHammer and RowPress. The previous studies have also attempted to understand the DRAM microarchitectures and associated behaviors, but we have found some of their results to be misled by inaccurate address mapping and internal data swizzling, or lack of a deeper understanding of the modern DRAM cell structure. For…
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Taxonomy
TopicsFerroelectric and Negative Capacitance Devices · Parallel Computing and Optimization Techniques · Advancements in Semiconductor Devices and Circuit Design
