High repetition rate ultrafast electron diffraction with direct electron detection

TL;DR

This paper presents a high-repetition-rate ultrafast electron diffraction instrument using direct electron detection, enabling sensitive, time-resolved measurements with low electron counts per pulse and improved temporal resolution.

Contribution

The paper introduces a novel UED setup operating at 30 kHz with direct electron detection, reducing space-charge effects and enhancing temporal resolution without pulse compression.

Findings

Achieved detection of time-resolved signals with high contrast

Instrument response function as low as 10^-5

Temporal resolution of 184 femtoseconds (FWHM)

Abstract

Ultrafast electron diffraction (UED) instruments typically operate at kHz or lower repetition rates and rely on indirect detection of electrons. However, these experiments encounter limitations because they are required to use electron beams containing a relatively large number of electrons (>>100 electrons/pulse), leading to severe space-charge effects. Consequently, electron pulses with long durations and large transverse diameters are used to interrogate the sample. Here, we introduce a novel UED instrument operating at a high repetition rate and employing direct electron detection. We operate significantly below the severe space-charge regime by using electron beams containing 1 to 140 electrons per pulse at 30-kHz. We demonstrate the ability to detect time-resolved signals from thin film solid samples with a difference contrast signal, ${\Delta}I/I_0$, and an instrument response function as low as $10^{-5}$ and 184-fs (FWHM), respectively, without temporal compression. Overall, our findings underscore the importance of increasing the repetition rate of UED experiments and adopting a direct electron detection scheme, which will be particularly impactful for gas-phase UED. Our newly developed scheme enables more efficient and sensitive investigations of ultrafast dynamics in photoexcited samples using ultrashort electron beams.