Deposition of highly-crystalline AlScN thin films using synchronized HiPIMS -- from combinatorial screening to piezoelectric devices
Jyotish Patidar (1), Kerstin Thorwarth (1), Thorsten Schmitz-Kempen, (2), Roland Kessels (2), Sebastian Siol (1) ((1) Empa, Swiss Federal, Laboratories for Materials Science, Technology, D\"ubendorf, Switzerland, (2) aixACCT Systems GmbH, Aachen, Germany)

TL;DR
This paper demonstrates a novel ionized physical vapor deposition method using synchronized HiPIMS to produce highly-crystalline, textured AlScN thin films at lower temperatures, suitable for advanced RF MEMS devices.
Contribution
It introduces a synchronized HiPIMS technique for depositing high-quality AlScN films with controlled stress and texture, overcoming previous temperature and defect limitations.
Findings
Achieved highly oriented AlScN films with minimal defects.
Successfully removed disoriented grains via substrate biasing.
Demonstrated conformal c-axis textured AlScN on structured wafers.
Abstract
Fueled by the 5G revolution, the demand for advanced radio frequency micro-electromechanical systems (MEMS) based on AlScN is growing rapidly. However, synthesizing high-quality, textured AlScN thin films is challenging. Current approaches typically rely on high temperatures and expensive compound targets. In this study, we demonstrate the feasibility of ionized physical vapor deposition to deposit highly oriented AlScN films with minimal defects at lower temperatures. Using metal-ion synchronized high-power impulse magnetron co-sputtering (MIS-HiPIMS) we can selectively bombard the growing film with Al and/or Sc ions to enhance the adatom mobility while simultaneously providing the ability to tune stress and coat complex structures conformally. We find that the Sc solubility in wurtzite AlN is slightly reduced, whereas crystallinity and texture are markedly improved. Disoriented…
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Taxonomy
TopicsAcoustic Wave Resonator Technologies · GaN-based semiconductor devices and materials · Metal and Thin Film Mechanics
