An Alternative Method to Identify the Susceptibility Threshold Level of Device under Test in a Reverberation Chamber

TL;DR

This paper proposes a new method to determine the susceptibility threshold of a device in a reverberation chamber by analyzing pass/fail counts, eliminating the need for power tuning and repeated tests, validated through Monte Carlo simulations.

Contribution

It introduces an alternative approach using statistical pass/fail counts to estimate the threshold electric field, reducing testing complexity and time.

Findings

Accurately estimates threshold E-field without tuning

Validates method with Monte Carlo simulations

Provides uncertainty analysis for different field distributions

Abstract

By counting the number of pass/fail occurrences of a DUT (Device under Test) in the stirring process in a reverberation chamber (RC), the threshold electric field (E-field) level can be well estimated without tuning the input power and repeating the whole testing many times. The Monte-Carlo method is used to verify the results. Estimated values and uncertainties are given for Rayleigh distributed fields and for Rice distributed fields with different K-factors.