Canalization-based super-resolution imaging using a single van der Waals layer
Jiahua Duan, Aitana Tarazaga Martin-Luengo, Christian Lanza, Stefan, Partel, Kirill Voronin, Ana Isabel F. Tresguerres-Mata, Gonzalo, \'Alvarez-P\'erez, Alexey Y. Nikitin, J. Mart\'in-S\'anchez, P., Alonso-Gonz\'alez

TL;DR
This paper demonstrates a novel super-resolution imaging technique using canalization in a single van der Waals layer, enabling high-resolution nanoimaging without complex fabrication.
Contribution
It introduces a new canalization phenomenon in a single vdW layer interfaced with a negative permittivity substrate, enabling super-resolution imaging.
Findings
Achieved super-resolution up to ~λ0/220
Demonstrated imaging at any location in the image plane
Controlled resolution via frequency, rotation, and thickness
Abstract
Canalization is an optical phenomenon that enables unidirectional propagation of light in a natural way, i.e., without the need for predefined waveguiding designs. Predicted years ago, it was recently demonstrated using highly confined phonon polaritons (PhPs) in twisted layers of the van der Waals (vdW) crystal alpha-MoO3, offering unprecedented possibilities for controlling light-matter interactions at the nanoscale. However, despite this finding, applications based on polariton canalization have remained elusive so far, which can be explained by the complex sample fabrication of twisted stacks. In this work, we introduce a novel canalization phenomenon, arising in a single vdW thin layer (alpha-MoO3) when it is interfaced with a substrate exhibiting a given negative permittivity, that allows us to demonstrate a proof-of-concept application based on polariton canalization:…
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Taxonomy
TopicsNear-Field Optical Microscopy · Photonic and Optical Devices · Advanced Optical Sensing Technologies
