Generally noise-resilient quantum gates for trapped-ions

TL;DR

This paper introduces a new entangling gate scheme for trapped-ion quantum computers that maintains high fidelity even with motional state excitations and errors, enhancing scalability and robustness.

Contribution

The proposed scheme incorporates all motional modes and improves robustness against heating and detuning errors, advancing trapped-ion quantum gate reliability.

Findings

Achieves high-fidelity entangling gates with excited motional states

Enhanced robustness against motional heating effects

Effective against detuning errors

Abstract

We present an entangling gate scheme for trapped-ion chains that achieves high-fidelity operations with excited motional states despite multiple error sources. Our approach incorporates all relevant motional modes and exhibits enhanced robustness against both motional heating effects and detuning errors, critical features for building robust and scalable trapped-ion quantum computers.