Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry
Sina M Koehlenbeck, Lance Lee, Mario D Balcazar, Ying Chen, Vincent, Esposito, Jerry Hastings, Matthias C Hoffmann, Zhirong Huang, May-Ling Ng,, Saxon Price, Takahiro Sato, Matthew Seaberg, Yanwen Sun, Adam White, Lin, Zhang, Brian Lantz, Diling Zhu

TL;DR
This paper presents a laser interferometry-based motion control system achieving nanoradian accuracy for X-ray optical systems, significantly improving stability and coherence in next-generation high-brightness X-ray sources.
Contribution
It introduces an optical metrology approach integrated with motion control to achieve nanoradian precision in X-ray optics, enabling advancements in high-coherence X-ray applications.
Findings
Achieved sub-microradian motion control accuracy
Demonstrated real-time compensation of optical element errors
Validated system performance on a prototype X-ray cavity
Abstract
The past decades have witnessed the development of new X-ray beam sources with brightness growing at a rate surpassing Moore's law. Current and upcoming diffraction limited and fully coherent X-ray beam sources, including multi-bend achromat based synchrotron sources and high repetition rate X-ray free electron lasers, puts increasingly stringent requirements on stability and accuracy of X-ray optics systems. Parasitic motion errors at sub-micro radian scale in beam transport and beam conditioning optics can lead to significant loss of coherence and brightness delivered from source to experiment. To address this challenge, we incorporated optical metrology based on interferometry and differential wavefront sensing as part of the X-ray optics motion control system. A prototype X-ray optics system was constructed following the optical layout of a tunable X-ray cavity. On-line…
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Taxonomy
TopicsAdvanced Measurement and Metrology Techniques · Adaptive optics and wavefront sensing · Advanced Surface Polishing Techniques
