Thermal relaxation of strain and twist in ferroelectric hexagonal boron nitride moir\'e interfaces
Marisa Hocking, Christina E. Henzinger, Steven Tran, Mihir Pendharkar,, Nathan J. Bittner, Kenji Watanabe, Takashi Taniguchi, David Goldhaber-Gordon,, Andrew J. Mannix

TL;DR
This study investigates how twist and strain in ferroelectric hBN/hBN moiré interfaces relax during thermal annealing, revealing temperature-dependent behaviors and the influence of structural irregularities on relaxation uniformity.
Contribution
It provides the first detailed characterization of interfacial twist and strain relaxation dynamics in hBN/hBN moiré interfaces during annealing at relevant temperatures.
Findings
Minimal relaxation at 170°C in air.
Significant twist relaxation at 400°C with decreased uniformity.
Heterostrain shows initial increase then decrease, becoming more non-uniform.
Abstract
New properties can arise at van der Waals (vdW) interfaces hosting a moir\'e pattern generated by interlayer twist and strain. However, achieving precise control of interlayer twist/strain remains an ongoing challenge in vdW heterostructure assembly, and even subtle variation in these structural parameters can create significant changes in the moir\'e period and emergent properties. Characterizing the rate of interlayer twist/strain relaxation during thermal annealing is critical to establish a thermal budget for vdW heterostructure construction and may provide a route to improve the homogeneity of the interface or to control its final state. Here, we characterize the spatial and temporal dependence of interfacial twist and strain relaxation in marginally-twisted hBN/hBN interfaces heated under conditions relevant to vdW heterostructure assembly and typical sample annealing. We find…
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Taxonomy
TopicsAcoustic Wave Resonator Technologies · Ferroelectric and Piezoelectric Materials · Ultrasonics and Acoustic Wave Propagation
