BayesFLo: Bayesian fault localization of complex software systems
Yi Ji, Simon Mak, Ryan Lekivetz, Joseph Morgan

TL;DR
BayesFLo introduces a Bayesian fault localization framework that incorporates domain knowledge and provides probabilistic risk assessments to improve debugging of complex software systems.
Contribution
It develops a novel Bayesian model and algorithms that integrate structural knowledge and efficiently compute root cause probabilities for fault localization.
Findings
BayesFLo outperforms existing methods in case studies.
It effectively incorporates domain knowledge into fault localization.
The framework provides probabilistic assessments of root causes.
Abstract
Software testing is essential for the reliable development of complex software systems. A key step in software testing is fault localization, which uses test data to pinpoint failure-inducing combinations for further diagnosis. Existing fault localization methods have two key limitations: they (i) largely do not incorporate domain and/or structural knowledge from test engineers, and (ii) do not provide a probabilistic assessment of risk for potential root causes. Such methods can thus fail to confidently whittle down the combinatorial number of potential root causes in complex systems, resulting in prohibitively high debugging costs. To address this, we propose a novel Bayesian fault localization framework called BayesFLo, which leverages a flexible Bayesian model for identifying potential root causes with probabilistic uncertainties. Using a carefully-specified prior on root cause…
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