Breakdown of the static dielectric screening approximation of Coulomb interactions in atomically thin semiconductors
Amine Ben Mhenni, Dinh Van Tuan, Leonard Geilen, Marko M. Petri\'c,, Melike Erdi, Kenji Watanabe, Takashi Taniguchi, Sefaattin Tongay, Kai, M\"uller, Nathan P. Wilson, Jonathan J. Finley, Hanan Dery, Matteo Barbone

TL;DR
This paper reveals that static dielectric screening models are insufficient for atomically thin semiconductors, showing that dynamical effects cause unexpected exciton blueshifts, which impacts the control of quantum states in layered materials.
Contribution
It demonstrates the breakdown of static dielectric screening approximation and introduces a dynamical screening model to better understand exciton behavior in 2D materials.
Findings
Exciton resonance blueshift exceeds 30 meV in high dielectric environments.
Static dielectric response mainly controls exciton binding energy.
High-frequency response dominates exciton self-energy effects.
Abstract
Coulomb interactions in atomically thin materials are uniquely sensitive to variations in the dielectric screening of the environment, which can be used to control quasiparticles and exotic quantum many-body phases. A static approximation of the dielectric response, where increased dielectric screening is predicted to cause an energy redshift of the exciton resonance, has been until now sufficient. Here, we use charge-tunable exciton resonances to study screening effects in transition metal dichalcogenide monolayers embedded in materials with dielectric constants ranging from 4 to more than 1000. In contrast to expectations, we observe a blueshift of the exciton resonance exceeding 30 meV for larger dielectric constant environments. By employing a dynamical screening model, we find that while the exciton binding energy remains mostly controlled by the static dielectric response, the…
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Semiconductor materials and devices · Surface and Thin Film Phenomena
