A novel method for determining the resistivity of compressed superconducting materials

TL;DR

This paper introduces a new method to measure the resistivity of superconducting materials under high pressure, overcoming previous technical challenges and enabling better understanding of their properties.

Contribution

The paper presents the first effective approach to determine high-pressure resistivity using ambient-pressure data and lattice parameters, validated on copper-oxide superconductors.

Findings

Method accurately estimates high-pressure resistivity.

Validated on copper-oxide superconductors.

Enables new high-pressure resistivity studies.

Abstract

The resistivity of a superconductor in its normal state plays a critical role in determining its superconducting ground state. However, measuring the resistivity of a material under high pressure has long presented a significant technical challenge due to pressure-induced changes in the crystallographic directions, especially for samples with anisotropic layered structures like high-Tc superconductors and other intriguing quantum materials. Here, we are the first to propose a novel and effective method for determining high-pressure resistivity, which relies on the ambient-pressure resistivity, initial sample sizes, lattice parameters, high-pressure resistance, and lattice parameters measured from the same sample. Its validity has been confirmed through our investigations of pressurized copper-oxide superconductors, which demonstrates that this method provides new possibilities for researchers conducting high-pressure studies related to resistivity of these materials.