Automation of Quantum Dot Measurement Analysis via Explainable Machine Learning
Daniel Schug, Tyler J. Kovach, M. A. Wolfe, Jared Benson, Sanghyeok, Park, J. P. Dodson, J. Corrigan, M. A. Eriksson, Justyna P. Zwolak

TL;DR
This paper presents an explainable machine learning approach for analyzing quantum dot measurement images, improving device tuning efficiency and transparency compared to traditional CNN methods.
Contribution
It introduces a novel vectorization method based on synthetic triangle modeling and demonstrates its effectiveness with explainable boosting machines for QD device analysis.
Findings
The new vectorization method outperforms previous approaches in explainability.
Explainable boosting machines achieve high accuracy in classifying measurement quality.
The approach enhances automated QD device calibration processes.
Abstract
The rapid development of quantum dot (QD) devices for quantum computing has necessitated more efficient and automated methods for device characterization and tuning. This work demonstrates the feasibility and advantages of applying explainable machine learning techniques to the analysis of quantum dot measurements, paving the way for further advances in automated and transparent QD device tuning. Many of the measurements acquired during the tuning process come in the form of images that need to be properly analyzed to guide the subsequent tuning steps. By design, features present in such images capture certain behaviors or states of the measured QD devices. When considered carefully, such features can aid the control and calibration of QD devices. An important example of such images are so-called , which visually represent current flow and reveal characteristics…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Explainable Artificial Intelligence (XAI) · ECG Monitoring and Analysis
