From PEFT to DEFT: Parameter Efficient Finetuning for Reducing Activation Density in Transformers
Bharat Runwal, Tejaswini Pedapati, Pin-Yu Chen

TL;DR
This paper introduces DEFT, a novel fine-tuning method that encourages activation sparsity in transformers, leading to significant reductions in activation density, memory, and runtime during inference across various models and tasks.
Contribution
The authors propose a density loss for PEFT methods that effectively reduces activation density, improving efficiency without sacrificing performance.
Findings
DEFT reduces activation density by up to 44.94% on RoBERTa and 53.19% on Flan-T5.
ADA-DEFT achieves up to 8.79% runtime and 17.46% memory savings.
DEFT complements quantization and pruning techniques for model efficiency.
Abstract
Pretrained Language Models (PLMs) have become the de facto starting point for fine-tuning on downstream tasks. However, as model sizes continue to increase, traditional fine-tuning of all the parameters becomes challenging. To address this, parameter-efficient fine-tuning (PEFT) methods have gained popularity as a means to adapt PLMs effectively. In parallel, recent studies have revealed the presence of activation sparsity within the intermediate outputs of the multilayer perceptron (MLP) blocks in transformers. Low activation density enables efficient model inference on sparsity-aware hardware. Building upon this insight, in this work, we propose a novel density loss that encourages higher activation sparsity (equivalently, lower activation density) in the pre-trained models. We demonstrate the effectiveness of our approach by utilizing mainstream PEFT techniques, including QLoRA,…
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Taxonomy
TopicsSemiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design
MethodsAdapter
