Advancing Scanning Probe Microscopy Simulations: A Decade of Development in Probe-Particle Models
Niko Oinonen, Aliaksandr V. Yakutovich, Aurelio Gallardo, Martin, Ondracek, Prokop Hapala, Ondrej Krejci

TL;DR
This paper presents significant advancements in the Probe-Particle Model for scanning probe microscopy, improving accuracy, performance, and usability, and demonstrating its broad applicability in surface science and molecular chemistry.
Contribution
The latest version of the Probe-Particle Model in the open-source ppafm package introduces enhanced accuracy, speed, and user-friendliness, enabling high-throughput simulations and machine learning applications.
Findings
Acceleration by 1-2 orders of magnitude using OpenMP and OpenCL
Inclusion of an interactive GUI and Python integration
Demonstrated broad applicability across various microscopy techniques
Abstract
The Probe-Particle Model combine theories designed for the simulation of scanning probe microscopy experiments, employing non-reactive, flexible tip apices to achieve sub-molecular resolution. In the article we present the latest version of the Probe-Particle Model implemented in the open-source ppafm package, highlighting substantial advancements in accuracy, computational performance, and userfriendliness. To demonstrate this we provide a comprehensive review of approaches for simulating non-contact Atomic Force Microscopy. They vary in complexity from simple Lennard-Jones potential to the latest full density-based model. We compared those approaches with ab initio calculated references, showcasing their respective merits. All parts of the ppafm package have undergone acceleration by 1-2 orders of magnitude using OpenMP and OpenCL technologies. The updated package includes n…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsForce Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Molecular Junctions and Nanostructures
