Increasing the resolution of transmission electron microscopy by computational ghost imaging

TL;DR

This paper demonstrates a novel computational ghost imaging technique in transmission electron microscopy that significantly enhances resolution beyond traditional aberration limits through structured illumination and single-pixel detection.

Contribution

It introduces a new method combining ghost imaging with electron microscopy to surpass resolution limits imposed by aberrations.

Findings

Achieved a twofold resolution increase beyond aberration limits

Validated the method through numerical simulations with realistic conditions

Used a simple 8-electrode device as an example

Abstract

By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The method requires measuring the intensity on a single pixel detector with a series of structured illuminations. The success of the technique is improved if the probes are made to resemble the sample and the patterns cover the area of interest evenly. By using a simple 8 electrode device as a specific example, a 2-fold increase in resolution beyond the aberration limit is demonstrated to be possible under realistic experimental conditions.