Few Shot Part Segmentation Reveals Compositional Logic for Industrial Anomaly Detection
Soopil Kim, Sion An, Philip Chikontwe, Myeongkyun Kang, Ehsan Adeli,, Kilian M. Pohl, Sang Hyun Park

TL;DR
This paper introduces a few-shot component segmentation model that leverages limited labeled data and unlabeled images to improve industrial anomaly detection by reasoning about component composition and logical constraints.
Contribution
The study presents a novel segmentation approach using histogram matching, entropy loss, and memory banks to enhance anomaly detection in industrial images with minimal supervision.
Findings
Achieves 98.1% AUROC on MVTec LOCO AD benchmark.
Outperforms existing methods with 89.6% AUROC.
Effectively detects logical anomalies with few labeled samples.
Abstract
Logical anomalies (LA) refer to data violating underlying logical constraints e.g., the quantity, arrangement, or composition of components within an image. Detecting accurately such anomalies requires models to reason about various component types through segmentation. However, curation of pixel-level annotations for semantic segmentation is both time-consuming and expensive. Although there are some prior few-shot or unsupervised co-part segmentation algorithms, they often fail on images with industrial object. These images have components with similar textures and shapes, and a precise differentiation proves challenging. In this study, we introduce a novel component segmentation model for LA detection that leverages a few labeled samples and unlabeled images sharing logical constraints. To ensure consistent segmentation across unlabeled images, we employ a histogram matching loss in…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnomaly Detection Techniques and Applications · Industrial Vision Systems and Defect Detection · Domain Adaptation and Few-Shot Learning
