Modelling reliability of reversible circuits with 2D second-order cellular automata

TL;DR

This paper explores the use of reversible second-order cellular automata to model the reliability of reversible circuits, analyzing damage propagation and fault sensitivity through numerical experiments.

Contribution

It introduces a novel approach to assess fault effects in reversible circuits using 2D second-order cellular automata, combining theoretical modeling with numerical analysis.

Findings

High sensitivity of damage patterns to errors and defects

Damage propagation is influenced by lack of synchronization

Short signal intervals increase fault susceptibility

Abstract

The cellular automaton is a widely known model of both reversible and irreversible computations. The family of reversible second-order cellular automata considered in this work is appropriate both for construction of logic gates and analysis of damage distribution. The quantities such as formal dimension of damage patterns can be used only for rough estimation of consequences of particular faults and numerical experiments are provided for illustration of some subtleties. Such analysis demonstrates high sensitivity to errors from defects, lack of synchronization and too short intervals between signals.