2-mm-Thick Large-Area CdTe Double-sided Strip Detectors for High-Resolution Spectroscopic Imaging of X-ray and Gamma-ray with Depth-Of-Interaction Sensing
Takahiro Minami, Miho Katsuragawa, Shunsaku Nagasawa, Shin'ichiro, Takeda, Shin Watanabe, Yutaka Tsuzuki, Tadayuki Takahashi

TL;DR
This paper presents a 2-mm-thick CdTe double-sided strip detector with high spatial and energy resolution, suitable for high-resolution spectroscopic imaging of X-ray and gamma-ray, demonstrating improved detection efficiency and DOI reconstruction accuracy.
Contribution
Development of a thick, large-area CdTe detector with enhanced spatial and energy resolution, and a theoretical model for DOI reconstruction and carrier-transport properties.
Findings
Achieved high energy resolution and 3D spatial resolution.
Reconstructed DOI with 100 um accuracy.
Maintained detector performance at -20°C with 500 V bias.
Abstract
We developed a 2-mm-thick CdTe double-sided strip detector (CdTe-DSD) with a 250 um strip pitch, which has high spatial resolution with a uniform large imaging area of 10 cm and high energy resolution with high detection efficiency in tens to hundreds keV. The detector can be employed in a wide variety of fields for quantitative observations of hard X-ray and soft gamma-ray with spectroscopic imaging, for example, space observation, nuclear medicine, and non-destructive elemental analysis. This detector is thicker than the 0.75-mm-thick one previously developed by a factor of 2.7, thus providing better detection efficiency for hard X-rays and soft gamma rays. The increased thickness could potentially enhance bias-induced polarization if we do not apply sufficient bias and if we do not operate at a low temperature, but the polarization is not evident in our detector when a high…
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Taxonomy
TopicsAdvanced X-ray and CT Imaging · Advanced Semiconductor Detectors and Materials · Nuclear Physics and Applications
