Understanding disorder in Silicon quantum computing platforms: Scattering mechanisms in Si/SiGe quantum wells
Yi Huang, Sankar Das Sarma

TL;DR
This paper theoretically investigates the scattering mechanisms affecting mobility in Si/SiGe quantum wells, identifying dominant sources at different densities and estimating the critical density for metal-insulator transition, with implications for quantum computing platforms.
Contribution
It provides a comprehensive theoretical analysis of disorder effects on mobility and the metal-insulator transition in Si/SiGe quantum wells, including the role of various scattering mechanisms and magnetic field effects.
Findings
Remote Coulomb impurities limit mobility at low densities.
Interface roughness limits mobility at higher densities.
Quantum mobility is mainly limited by background impurities.
Abstract
Motivated by recent experiments on Si/SiGe quantum wells with a co-design of high electron mobility and large valley splitting [B. Paquelet Wuetz, et al., Nature Communications 14, 1385 (2023); D. D. Esposti, et al., arXiv:2309.02832], suitable for a Si-based spin qubit quantum computing platform, we examine the role of disorder by theoretically calculating mobility and quantum mobility from various scattering mechanisms and their dependence on the electron density. At low electron densities cm, we find that mobility is limited by remote Coulomb impurities in the capping layer, whereas interface roughness becomes the significant limiting factor at higher densities. We also find that alloy disorder scattering is not a limiting mechanism in the reported high-mobility structures. We estimate the critical density of the disorder-driven low-density…
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Taxonomy
TopicsQuantum and electron transport phenomena · Surface and Thin Film Phenomena · Advancements in Semiconductor Devices and Circuit Design
