Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale
Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume, Prenat, Lorena Anghel, Mehdi B. Tahoori

TL;DR
This paper introduces Scale Dropout, a scalable and energy-efficient Bayesian neural network method using stochastic scale, which significantly reduces hardware overhead while maintaining high-quality uncertainty estimation.
Contribution
It proposes a novel Scale Dropout technique for BNNs that uses only one stochastic unit regardless of model size, enabling scalable and efficient uncertainty estimation.
Findings
Achieves over 100x energy savings with spintronic CIM architecture.
Provides up to 1% improvement in predictive performance.
Offers superior uncertainty estimates compared to existing methods.
Abstract
Uncertainty estimation in Neural Networks (NNs) is vital in improving reliability and confidence in predictions, particularly in safety-critical applications. Bayesian Neural Networks (BayNNs) with Dropout as an approximation offer a systematic approach to quantifying uncertainty, but they inherently suffer from high hardware overhead in terms of power, memory, and computation. Thus, the applicability of BayNNs to edge devices with limited resources or to high-performance applications is challenging. Some of the inherent costs of BayNNs can be reduced by accelerating them in hardware on a Computation-In-Memory (CIM) architecture with spintronic memories and binarizing their parameters. However, numerous stochastic units are required to implement conventional dropout-based BayNN. In this paper, we propose the Scale Dropout, a novel regularization technique for Binary Neural Networks…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdversarial Robustness in Machine Learning · Fault Detection and Control Systems · Radiation Effects in Electronics
MethodsDropout
