On-chip light-scattering enhancement enables high performance single-particle tracking under conventional bright-field microscope
Pengcheng Zhang, Tingting Zhan, Guoqiang Gu, Changle Li, Mengting Lyu,, Yi Zhang, and Hui Yang

TL;DR
This paper introduces a simple on-chip microlens-based method to significantly enhance light scattering, enabling high-performance single-particle tracking with low illumination power under standard microscopes, broadening its practical applications.
Contribution
The authors develop a robust on-chip microlens strategy that provides tenfold light-scattering enhancement, overcoming limitations of previous field-enhancement techniques for particle tracking.
Findings
Achieved ten times greater light-scattering enhancement.
Enabled high-performance single-particle tracking under conventional microscopes.
Reduced illumination power by over 1,000 times.
Abstract
Scattering-based single-particle tracking (S-SPT) has opened new avenues for highly sensitive label-free detection and characterization of nanoscopic objects, making it particularly attractive for various analytical applications. However, a long-standing issue hindering its widespread applicability is its high technical demands on optical systems. The most promising solution entails implementing on-chip light-scattering enhancement, but the existing field-enhancement technology fails as their highly localized field is insufficient to cover the three-dimensional trajectory of particles within the interrogation time. Here, we present a straightforward and robust on-chip microlens-based strategy for light-scattering enhancement, providing an enhancement range ten times greater than that of near-field optical techniques. These properties are attributed to the increased long-range optical…
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Taxonomy
TopicsNear-Field Optical Microscopy · Quantum Dots Synthesis And Properties · Advanced Fluorescence Microscopy Techniques
