Characteristic Modes of Frequency-Selective Surfaces and Metasurfaces from S-parameter Data

TL;DR

This paper introduces a method to analyze characteristic modes of 2D periodic systems using S-parameter data, enabling mode computation from generic simulation or measurement data without complex integral equations.

Contribution

It presents a novel approach to determine characteristic modes directly from S-parameters, simplifying analysis of frequency-selective surfaces and metasurfaces.

Findings

Method accurately matches traditional formulations

Vertical structure significantly affects mode count

Demonstrated on multiband and beamsteering metasurfaces

Abstract

Characteristic modes of arbitrary two-dimensional periodic systems are analyzed using scattering parameter data. This approach bypasses the need for periodic integral equations and allows for characteristic modes to be computed from generic simulation or measurement data. Example calculations demonstrate the efficacy of the method through comparison against a periodic method of moments formulation for a simple, single-layer conducting unit cell. The effect of vertical structure and electrical size on the number of modes is studied and its discrete nature is verified with example calculations. % Additional examples verify the binary impact of vertical structure on the number of radiating characteristic modes. A multiband polarization-selective surface and a beamsteering metasurface are presented as additional examples.