Gain profile characterization and modelling for an accurate EDFA abstraction and control
Giacomo Borraccini, Vittorio Gatto, Andrea D'Amico, Stefano Straullu,, Francesco Aquilino, Stefano Piciaccia, Alberto Tanzi, Gabriele Galimberti and, Vittorio Curri
TL;DR
This paper presents a gain profile model for dual-stage EDFAs based on a two-measurement characterization, validated across full spectral load conditions and different commercial devices, enabling accurate EDFA control.
Contribution
The paper introduces a novel gain profile model for dual-stage EDFAs that relies on only two measurements for accurate spectral and dynamic reproduction.
Findings
Model accurately reproduces EDFA dynamics
Validated on two commercial EDFA units
Effective across full spectral load conditions
Abstract
Relying on a two-measurement characterization phase, a gain profile model for dual-stage EDFAs is presented and validated in full spectral load condition. It precisely reproduces the EDFA dynamics varying the target gain and tilts parameters as shown experimentally on two commercial items from different vendors.
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Taxonomy
TopicsSemiconductor Lasers and Optical Devices · Photonic and Optical Devices · Optical Network Technologies