Signum phase mask differential microscopy
Jeeban Kumar Nayak, Niladri Modak, Sayan Ghosh, Nirmalya Ghosh

TL;DR
This paper introduces a simple, low-cost differential microscopy technique using a Signum phase mask that enables simultaneous amplitude, phase, and polarization gradient imaging without polarized light, suitable for high-resolution, label-free applications.
Contribution
The authors develop a novel Signum phase mask-based differential microscopy method that simplifies setup and eliminates the need for polarized light, enabling multi-contrast imaging in a single system.
Findings
Successfully demonstrated simultaneous amplitude, phase, and polarization gradient imaging.
Achieved high-resolution, broad wavelength range imaging.
Provided a low-cost, versatile tool for label-free microscopy.
Abstract
We propose and experimentally demonstrate a differential microscopy method to obtain simultaneous amplitude, phase, and quantitative polarization gradient imaging in a single experimental embodiment. A full-field optical spatial differentiator is achieved in a relatively simple setup by placing a glass cover slip as a Signum phase mask in the Fourier plane of a standard 4-f imaging system and accordingly named Signum phase mask differential microscopy. The longstanding requisite of polarized light to obtain the spatial differentiation of the field at the object plane is eliminated in our scheme and, hence, leads to the emergence of quantitative differential polarization contrast imaging by integrating polarization degree of freedom as an additional contrast agent in the framework of differential microscopy. Implementation of the proposed differential imaging scheme in high-resolution…
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Taxonomy
TopicsDigital Holography and Microscopy · Advanced Fluorescence Microscopy Techniques · Near-Field Optical Microscopy
